Amin Karbasi

Amin Karbasi's picture
Assistant Professor of Electrical Engineering and of Computer Science
Office 326,
Yale Institute for Network Science,
17 Hillhouse Ave, New Haven, CT 06511-8965
Yale University


Amin Karbasi is an assistant professor in the School of Engineering and Applied Science (SEAS) at Yale University, where he leads the Inference, Information, and Decision (I.I.D.) Systems Group. Prior to that he was a post-doctoral scholar at ETH Zurich, Switzerland (2013-2014). He obtained his Ph.D. (2012) and M.Sc. (2007) in computer and communication sciences from EPFL, Switzerland and his B.Sc. (2004) in electrical engineering from the same university.

Awards and Recognition

  • NSF CAREER Award 2019

  • ONR Young Investigator Award 2019

  • Amazon Research Award 2018

  • AFOSR  Young Investigator Award 2018 

  • MICCAI Young Scientist Award 2017  for the paper “A Submodular Approach to Create Individualized  Parcellations of Human Brain”

  • Microsoft Azure Research Award 2017

  • Grainger Award 2017 from National Academy of Engineering for Advancement of Interdisciplinary Research

  • Simons Research Fellowship 2017 for “Foundations of Machine Learning”

  • DARPA Young Faculty Award 2016 

  • Google Faculty Research Award 2016

  • AISTATS Best Student Paper Award 2015 for the paper “Tradeoffs for Space, Time, Data and Risk in Unsupervised Learning”

  • IEEE Data Storage Best Student Paper Award 2013 for the paper “Noise-Enhanced Associative Memories”

  • Patrick Denantes Memorial Prize 2013 for the best Ph.D. thesis in the school of computer and communication sciences at EPFL

  • ETHZ Fellowship Grant 2013

  • ICASSP Best Student Paper Award 2011 for the paper “Calibration in Circular Ultrasound Tomography Devices”

  • ACM SIGMETRICS Best Student Paper Award 2010 for the paper “Distributed Sensor Network Localization from Local Connectivity: Performance Analysis for the HOP-TERRAIN Algorithm”

  • ISIT Best Student Paper Award Nominee 2010 for the paper “Graph-Constrained Group Testing”